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1

Chopper-Stabilized Low-Noise Multipath Operational Amplifier with Dual Ripple Rejection Loops

Kim, Hyungseup, Han, Kwonsang, Kim, Jaesung, You, Donggeun, Heo, Hyunwoo, Kwon, Yongsu, Kim, Choul-Young, Lee, Hi-Deok, Ko, Hyoungho

Journal:

IEEE Transactions on Circuits and Systems II: Express Briefs

Year:

2020

File:

PDF, 1.44 MB

2020

2

Investigation of Intra-Nitride Charge Migration Suppression in SONOS Flash Memory

Yang, Seung-Dong, Jung, Jun-Kyo, Lim, Jae-Gab, Park, Seong-gye, Lee, Hi-Deok, Lee, Ga-Won

Journal:

Year:

2019

Language:

english

File:

PDF, 2.38 MB

english, 2019

3

[IEEE 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (2006.7.3-2006.7.3)] 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits - New Failure Analysis of Tungsten Plug Corrosion in Via Process

Kim, Dong-sun, Ho, Won-joon, Kim, Jae-yeong, Shin, Eui-yong, Kim, Jin-ha, Lee, Hi-deok

Year:

2006

Language:

english

File:

PDF, 2.12 MB

english, 2006

4

Effects of shallow trench isolation on low frequency noise characteristics of source-follower transistors in CMOS image sensors

Kwon, Sung-Kyu, Kwon, Hyuk-Min, Choi, Woon-Il, Song, Hyeong-Sub, Lee, Hi-Deok

Journal:

Solid-State Electronics

Year:

2016

Language:

english

File:

PDF, 813 KB

english, 2016

5

Uncooled Microbolometer Arrays With High Responsivity Using Meshed Leg Structure

Kim, Young Su, Kim, Tae Hyun, Kim, Gyung Tae, Lim, Boo Taek, Lim, Seong Kyu, Lee, Hi Deok, Lee, Ga Won

Journal:

IEEE Photonics Technology Letters

Year:

2013

Language:

english

File:

PDF, 573 KB

english, 2013

6

A thermal inkjet printhead with a monolithically fabricated nozzle plate and self-aligned ink feed hole

Jae-Duk Lee,, Jun-Bo Yoon,, Jae-Kwan Kim,, Hoon-Ju Chung,, Choon-Sup Lee,, Hi-Deok Lee,, Ho-Jun Lee,, Choong-Ki Kim,, Chul-Hi Han,

Journal:

Journal of Microelectromechanical Systems

Year:

1999

Language:

english

File:

PDF, 547 KB

english, 1999

7

[IEEE 2011 International Conference on Microelectronic Test Structures (ICMTS) - Amsterdam, Netherlands (2011.04.4-2011.04.7)] 2011 IEEE ICMTS International Conference on Microelectronic Test Structures - Novel BJT test structure for high-performance matching characteristics in CMOS-based analog applications

Jung, Yi-Jung, Park, Byoung-Seok, Han, In-Shik, Kwon, Hyuk-Min, Park, Sang-Uk, Bok, Jung-Deuk, Chung, Yi-Sun, Lim, Min-Gyu, Lee, Jung-Hwan, Lee, Hi-Deok

Year:

2011

Language:

english

File:

PDF, 153 KB

english, 2011

8

Investigation of atomic-layer-deposited Al-doped ZnO film for AZO/ZnO double-stacked active layer thin-film transistor application

Jeong, Jun-Kyo, Yun, Ho-Jin, Yang, Seung-Dong, Eom, Ki-Yun, Chea, Seong-Won, Park, Jeong-Hyun, Lee, Hi-Deok, Lee, Ga-Won

Journal:

Thin Solid Films

Year:

2017

Language:

english

File:

PDF, 2.13 MB

english, 2017

9

Effect of Si capping layer on the interface quality and NBTI of high mobility channel Ge-on-Si pMOSFETs

Ook Sang Yoo, Jungwoo Oh, Kyung Seok Min, Chang Yong Kang, B.H. Lee, Kyong Taek Lee, Min Ki Na, Hyuk-Min Kwon, P. Majhi, H-H Tseng, Raj Jammy, J.S. Wang, Hi-Deok Lee

Journal:

Microelectronic Engineering

Year:

2009

Language:

english

File:

PDF, 320 KB

english, 2009

10

Shallow Trench Isolation Characteristics with High-Density-Plasma Chemical Vapor Deposition Gap-Fill Oxide for Deep-Submicron CMOS Technologies

Lee, Seung-Ho, Son, Jeong-Hwan, Lee, Hi-Deok, Yang, Wouns, Lee, Young-Jong

Journal:

Japanese Journal of Applied Physics

Year:

1998

File:

PDF, 884 KB

1998

11

Comparison of Ohmic contact resistances of n- and p-type Ge source/drain and their impact on transport characteristics of Ge metal oxide semiconductor field effect transistors

Jungwoo Oh, Jeff Huang, Yen-Ting Chen, Injo Ok, Kanghoon Jeon, Se-Hoon Lee, Barry Sassman, Wei-Yip Loh, Hi-Deok Lee, Dea-Hong Ko, Prashant Majhi, Paul Kirsch, Raj Jammy

Journal:

Thin Solid Films

Year:

2011

Language:

english

File:

PDF, 541 KB

english, 2011

12

Accurate extraction of reverse leakage current components of shallow silicided p+-n junction for quarter- and sub-quarter-micron MOSFET's

Hi-Deok Lee, Jeong-Mo Hwang

Journal:

IEEE Transactions on Electron Devices

Year:

1998

Language:

english

File:

PDF, 89 KB

english, 1998

13

N+/P junction leakage characteristics of Co salicide process for 0.15 μm CMOS devices

Key-Min Lee, Chel-Jong Choi, Joo-Hyoung Lee, Tae-Yeon Seong, Young-Jin Park, Sung-Kwon Hong, Jae-Gyung Ahn, Hi-Deok Lee

Journal:

IEEE Transactions on Electron Devices

Year:

2002

Language:

english

File:

PDF, 205 KB

english, 2002

14

A study of stress-induced p+/n salicided junction leakage failure and optimized process conditions for sub-0.15-μm CMOS technology

Joo-Hyoung Lee, Sung-Hyung Park, Key-Min Lee, Ki-Seok Youn, Young-Jin Park, Chel-Jong Choi, Tae-Yeon Seong, Hi-Deok Lee

Journal:

IEEE Transactions on Electron Devices

Year:

2002

Language:

english

File:

PDF, 1.46 MB

english, 2002

15

Experimental evidence for nonlucky electron model effect in 0.15-μm NMOSFETs

Sang-Gi Lee, Jeong-Mo Hwang, Hi-Deok Lee

Journal:

IEEE Transactions on Electron Devices

Year:

2002

Language:

english

File:

PDF, 531 KB

english, 2002

16

A Novel BJT Structure Implemented Using CMOS Processes for High-Performance Analog Circuit Applications

Jung, Yi-Jung, Park, Byoung-Seok, Kwon, Hyuk-Min, Kwon, Sung-Kyu, Jang, Jae-Hyung, Kwak, Ho-Young, Chung, Yi-Sun, Lee, Jung-Hwan, Lee, Hi-Deok

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2012

Language:

english

File:

PDF, 9.06 MB

english, 2012

17

Characterization of Al2O3–HfO2–Al2O3 sandwiched MIM capacitor under DC and AC stresses

Kwak, Ho-Young, Kwon, Hyuk-Min, Jung, Yi-Jung, Kwon, Sung-Kyu, Jang, Jae-Hyung, Choi, Woon-Il, Ha, Man-Lyun, Lee, Ju-Il, Lee, Song-Jae, Lee, Hi-Deok

Journal:

Solid-State Electronics

Year:

2013

Language:

english

File:

PDF, 492 KB

english, 2013

18

3D gate-all-around bandgap-engineered SONOS flash memory in vertical silicon pillar with metal gate

Oh, Jae-Sub, Yang, Seong-Dong, Lee, Sang-Youl, Kim, Young-Su, Kang, Min-Ho, Lim, Sung-Kyu, Lee, Hi-Deok, Lee, Ga-Won

Journal:

Solid-State Electronics

Year:

2013

Language:

english

File:

PDF, 1.19 MB

english, 2013

19

Time-Dependent Dielectric Breakdown of $\hbox{La}_{2} \hbox{O}_{3}$-Doped High-$k$/Metal Gate Stacked NMOSFETs

In-Shik Han,, Won-Ho Choi,, Hyuk-Min Kwon,, Min-Ki Na,, Ying-Ying Zhang,, Yong-Goo Kim,, Jin-Suk Wang,, Chang Yong Kang,, Bersuker, G., Byoung Hun Lee,, Yoon Ha Jeong,, Hi-Deok Lee,, Jammy,

Journal:

IEEE Electron Device Letters

Year:

2009

Language:

english

File:

PDF, 306 KB

english, 2009

20

Effects of High-Pressure Annealing on Random Telegraph Signal Noise Characteristic of Source Follower Block in CMOS Image Sensor

Kwon, Hyuk-Min, Han, In-Shik, Kwon, Sung-Kyu, Jang, Jae-Hyung, Kwak, Ho-Young, Choi, Woon-Il, Ha, Man-Lyun, Lee, Ju-Il, Hwang, Hyun-sang, Lee, Hi-Deok

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 310 KB

english, 2013

21

A Correlation Between Oxygen Vacancies and Reliability Characteristics in a Single Zirconium Oxide Metal-Insulator-Metal Capacitor

Kwon, Hyuk-Min, Kwon, Sung-Kyu, Jeong, Kwang-Seok, Oh, Sung-Kwen, Oh, Sun-Ho, Choi, Woon-Il, Kim, Tae-Woo, Kim, Dae-Hyun, Kang, Chang-Yong, Lee, Byoung Hun, Kirsch, Paul, Lee, Hi-Deok

Journal:

IEEE Transactions on Electron Devices

Year:

2014

Language:

english

File:

PDF, 4.10 MB

english, 2014

22

-State Leakage and Reliability in Metal-Gate/High- $k$ Dielectric MOSFETs

Kyong Taek Lee,, Chang Yong Kang,, Byung Sun Ju,, Choi, R., Kyung Seok Min,, Ook Sang Yoo,, Byoung Hun Lee,, Jammy, R., Lee, J.C., Hi-Deok Lee,, Yoon-Ha Jeong,

Journal:

IEEE Electron Device Letters

Year:

2008

Language:

english

File:

PDF, 409 KB

english, 2008

23

A Study of Dielectric Relaxation and Capacitance Matching of ${\rm Al}_{2}{\rm O}_{3}/{\rm HfO}_{2}/{\rm Al}_{2}{\rm O}_{3}$ MIM Capacitors

Han, In-Shik, Kwon, Hyuk-Min, Kwon, Sung-Kyu, Choi, Woon-Il, Lim, Su, Kim, Jin-Soo, Kim, Moon-Ho, Ha, Man-Lyun, Lee, Ju-Il, Lee, Hi-Deok

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 477 KB

english, 2013

24

[IEEE 2010 IEEE Nanotechnology Materials and Devices Conference (NMDC) - Monterey, CA, USA (2010.10.12-2010.10.15)] 2010 IEEE Nanotechnology Materials and Devices Conference - An analysis on applicability of Ti-doped ZnO films as the channel layer of TFTs

Jeong, Kwang-Seok, Kim, Young-Su, Kim, Yu-Mi, Park, Jeong-Gyu, Yang, Seung-Dong, Yun, Ho-Jin, Lee, Hi-Deok, Lee, Ga-Won

Year:

2010

Language:

english

File:

PDF, 1018 KB

english, 2010

25

Abnormal Junction Profile of Submicrometer Complementary Metal Oxide Semiconductor Devices with Co Silicidation and Shallow Trench Isolation Processes

Choi, Chel-Jong, Seong, Tae-Yeon, Lee, Key-Min, Lee, Joo-Hyoung, Park, Young-Jin, Lee, Hi-Deok

Journal:

Electrochemical and Solid-State Letters

Year:

2001

Language:

english

File:

PDF, 115 KB

english, 2001

26

The impact of gate to drain spacing on hot-carrier degradation in sub-100nm Ni–Pt salicidation FinFETs

Lee, Seung Min, Lee, Hi-Deok, Ok, Injo, Oh, Jungwoo

Journal:

Solid-State Electronics

Year:

2015

Language:

english

File:

PDF, 1.22 MB

english, 2015

27

Current–voltage and low-frequency noise analysis of heterojunction diodes with various passivation layers

Ko, Young-Uk, Yun, Ho-Jin, Jeong, Kwang-Seok, Kim, Yu-Mi, Yang, Seung-Dong, Kim, Seong-Hyeon, Kim, Jin-Sup, An, Jin-Un, Lee, Hi-Deok, Lee, Ga-Won

Journal:

Thin Solid Films

Year:

2016

Language:

english

File:

PDF, 1.77 MB

english, 2016

28

Downsizing gas sensors based on semiconducting metal oxide: Effects of electrodes on gas sensing properties

Song, Young Geun, Shim, Young-Seok, Kim, Sangtae, Han, Soo Deok, Moon, Hi Gyu, Noh, Myoung Sub, Lee, Kwangjae, Lee, Hae Ryong, Kim, Jin-Sang, Ju, Byeong-Kwon, Kang, Chong-Yun

Journal:

Sensors and Actuators B: Chemical

Year:

2017

Language:

english

File:

PDF, 1016 KB

english, 2017

29

ULTRASONOGRAPHIC CHANGES OF UPPER EXTREMITY TENDONS IN RECREATIONAL BADMINTON PLAYERS: THE EFFECT OF HAND DOMINANCE AND COMPARISON WITH CLINICAL FINDINGS

Park, Jin, Lee, Young-Hee, Kong, In Deok, Park, Tae-jun, Chang, Jae Seung, Kim, Taeho, Lee, Hi Chan

Journal:

British Journal of Sports Medicine

Year:

2017

Language:

english

File:

PDF, 61 KB

english, 2017

30

Epitaxial ZnO gate dielectrics deposited by RF sputter for AlGaN/GaN metal-oxide-semiconductor high-electron-mobility transistors

Yoon, Seonno, Lee, Seungmin, Kim, Hyun-Seop, Cha, Ho-Young, Lee, Hi-Deok, Oh, Jungwoo

Journal:

Semiconductor Science and Technology

Year:

2018

Language:

english

File:

PDF, 2.91 MB

english, 2018

31

Effects of Fluorine on the NBTI Reliability and Low-Frequency Noise Characteristics of p-MOSFETs

Kwon, Sung-Kyu, Kwon, Hyuk-Min, Han, In-Shik, Jang, Jae-Hyung, Oh, Sun-Ho, Song, Hyeong-Sub, Park, Byoung-Seok, Chung, Yi-Sun, Lee, Jung-Hwan, Lee, Jung-Hwan, Kim, Si-Bum, Lee, Ga-won, Hi-Deok,

Journal:

IEEE Journal of the Electron Devices Society

Year:

2018

Language:

english

File:

PDF, 579 KB

english, 2018

32

Investigation of Intra-Nitride Charge Migration Suppression in SONOS Flash Memory

Yang, Seung-Dong, Jung, Jun-Kyo, Lim, Jae-Gab, Park, Seong-gye, Lee, Hi-Deok, Lee, Ga-Won

Journal:

Year:

2019

File:

PDF, 2.38 MB

2019

33

A 5.43 nV/âHz Chopper Operational Amplifier Using Lateral PNP Input Stage with BJT Current Mirror Base Current Cancellation

Kim, Hyungseup, Kwon, Yongsu, You, Donggeun, Choi, Hyun-Woong, Kim, Seong Hyun, Heo, Hyunwoo, Kim, Choul-Young, Lee, Hi-Deok, Ko, Hyoungho

Journal:

Applied Sciences

Year:

2020

File:

PDF, 54.97 MB

2020

34

Ab initio comparative study of C54 and C49 TiSi2 surfaces

Tao Wang, Soon-Young Oh, Won-Jae Lee, Yong-Jin Kim, Hi-Deok Lee

Journal:

Applied Surface Science

Year:

2006

Language:

english

File:

PDF, 495 KB

english, 2006

35

Comparison of La-based high-k dielectrics: HfLaSiON and HfLaON

Won-Ho Choi, In-Shik Han, Hyuk-Min Kwon, Tae-Gyu Goo, Min-Ki Na, Ook-Sang Yoo, Ga-Won Lee, Chang Yong Kang, Rino Choi, Seung Chul Song, Byoung Hun Lee, Raj Jammy, Yoon-Ha Jeong, Hi-Deok Lee

Journal:

Microelectronic Engineering

Year:

2009

Language:

english

File:

PDF, 212 KB

english, 2009

36

Fabrication and characterization of humidity sensor based on (Li2MoO4)x(CaMoO4)1−x system

Il Jin Kim, Sang Do Han, Hi Deok Lee, Jin Suk Wang, Ishwar Singh, S.V. Kornilov

Journal:

Materials Science and Engineering: B

Year:

2005

Language:

english

File:

PDF, 144 KB

english, 2005

37

Ab initio study of the elastic properties of TiSi2

Tao Wang, Hi-Deok Lee, Soon-Young Oh, Yong-Jin Kim, Won-Jae Lee

Journal:

Materials Science in Semiconductor Processing

Year:

2005

Language:

english

File:

PDF, 182 KB

english, 2005

38

The meta-stable dip (MSD) effect in SOI FinFETs

Jang-Gn Yun, Maryline Bawedin, Sorin Cristoloveanu, Denis Flandre, Hi-Deok Lee

Journal:

Microelectronic Engineering

Year:

2007

Language:

english

File:

PDF, 217 KB

english, 2007

39

Preface

Hsing-Huang Tseng, Byoung Hun Lee, Hi-Deok Lee

Journal:

Microelectronic Engineering

Year:

2009

Language:

english

File:

PDF, 97 KB

english, 2009

40

Chromomycosis presenting as soft-tissue mass: report of a case with MRI features

Won-Jong Bahk, Eun-Deok Chang, Kyung-Ah Chun, An-Hi Lee, Jung-Mi Park, Yong-Whee Bahk

Journal:

Skeletal Radiology

Year:

2009

Language:

english

File:

PDF, 233 KB

english, 2009

41

Effect of Si interlayer thickness and post-metallization annealing on Ge MOS capacitor on Ge-on-Si substrate

Ook Sang Yoo, Jungwoo Oh, Chang Yong Kang, Byoung Hun Lee, In Shik Han, Won-Ho Choi, Hyuk-Min Kwon, Min-Ki Na, Prashant Majhi, Hsing-Huang Tseng, Raj Jammy, Jin Suk Wang, Hi-Deok Lee

Journal:

Materials Science and Engineering: B

Year:

2008

Language:

english

File:

PDF, 710 KB

english, 2008

42

Involvement of urokinase-type plasminogen activator in sphingosylphosphorylcholine-induced angiogenesis

Yong-Jun Piao, Chang-Hi Lee, Ming Ji Zhu, Kyung-Chae Kye, Jin-Man Kim, Young-Joon Seo, Ki-Beom Suhr, Jang-Kyu Park, Chang Deok Kim, Jeung-Hoon Lee

Journal:

Experimental Dermatology

Year:

2005

Language:

english

File:

PDF, 897 KB

english, 2005

43

Fabrication of TiSi2using microwave hydrogen plasma annealing

Tao Wang, Hi-Deok Lee, Y. B. Dai

Journal:

Journal of Materials Engineering and Performance

Year:

2005

Language:

english

File:

PDF, 80 KB

english, 2005

44

Correlation of low frequency noise characteristics with the interfacial charge exchange reaction at graphene devices

Sang Kyung Lee, Chang Goo Kang, Young Gon Lee, Chunhum Cho, Eunji Park, Hyun Jong Chung, Sunae Seo, Hi-Deok Lee, Byoung Hun Lee

Journal:

Year:

2012

Language:

english

File:

PDF, 604 KB

english, 2012

45

Analysis of trap effect on reliability using the charge pumping technology in La-incorporated high-k dielectrics

Hyuk-Min Kwon, Won-Ho Choi, In-Shik Han, Sang-Uk Park, Byoung-Seok Park, Ying-Ying Zhang, Chang-Yong Kang, Byoung-Hun Lee, Raj Jammy, Hi-Deok Lee

Journal:

Microelectronic Engineering

Year:

2011

Language:

english

File:

PDF, 550 KB

english, 2011

46

Characterization of device performance and reliability of high performance Ge-on-Si field-effect transistor

Won-Ho Choi, Jungwoo Oh, Ook-Sang Yoo, In-Shik Han, Min-Ki Na, Hyuk-Min Kwon, Byung-Suk Park, P. Majhi, H.-H. Tseng, R. Jammy, Hi-Deok Lee

Journal:

Microelectronic Engineering

Year:

2011

Language:

english

File:

PDF, 582 KB

english, 2011

47

Analysis of reliability characteristics of high capacitance density MIM capacitors with SiO2–HfO2–SiO2 dielectrics

Sang-Uk Park, Chang-Yong Kang, Hyuk-Min Kwon, Byung-Seok Park, Won-Ho Choi, In-Shik Han, Gennadi Bersuker, Raj Jammy, Hi-Deok Lee

Journal:

Microelectronic Engineering

Year:

2011

Language:

english

File:

PDF, 791 KB

english, 2011

48

Carrier transport mechanism in La-incorporated high-k dielectric/metal gate stack MOSFETs

Hyuk-Min Kwon, Won-Ho Choi, In-Shik Han, Min-Ki Na, Sang-Uk Park, Jung-Deuk Bok, Chang-Yong Kang, Byoung-Hun Lee, Raj Jammy, Hi-Deok Lee

Journal:

Microelectronic Engineering

Year:

2011

Language:

english

File:

PDF, 556 KB

english, 2011

49

Ex-situ and in-situ analyses on reaction mechanism of CuInSe2 (CIS) formed by selenization of sputter deposited CuIn precursor with Se vapor

Dong Gwon Moon, SeJin Ahn, Jae Ho Yun, Ara Cho, Jihye Gwak, SeungKyu Ahn, Keeshik Shin, Kyunghoon Yoon, Hi-Deok Lee, Hisun Pak, Sehan Kwon

Journal:

Solar Energy Materials and Solar Cells

Year:

2011

Language:

english

File:

PDF, 1.62 MB

english, 2011

50

On-chip characterization of interconnect parameters and time delay in 0.18 μm CMOS technology for ULSI circuit applications

Hi-Deok Lee, Kim, D.M., Myoung-Jun Jang

Journal:

IEEE Transactions on Electron Devices

Year:

2000

Language:

english

File:

PDF, 300 KB

english, 2000